Evidence map›Paper›PMID 32331313›Full record

ReviewNanomaterials (Basel, Switzerland)2020

Conductive Atomic Force Microscopy of Semiconducting Transition Metal Dichalcogenides and Heterostructures.

Filippo Giannazzo, Emanuela Schilirò, Giuseppe Greco, Fabrizio Roccaforte

Abstract readReview
In one paragraph

Review in Nanomaterials (Basel, Switzerland), 2020. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 12 papers.

0numbers the graph read from it
0cells of the map it votes in
12citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

12 citing papers in PubMed.

  1. Review
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  6. Review
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4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

4 authors.

Filippo GiannazzoCNR-IMM, Strada VIII, 5-5121 Catania, Italy.
Emanuela SchiliròCNR-IMM, Strada VIII, 5-5121 Catania, Italy.
Giuseppe GrecoCNR-IMM, Strada VIII, 5-5121 Catania, Italy.
Fabrizio RoccaforteCNR-IMM, Strada VIII, 5-5121 Catania, Italy.

Funding

Ministero dell'Istruzione, dell'Università e della Ricerca FlagERA-JTC2015 project "GraNitE"Ministero dell'Istruzione, dell'Università e della Ricerca FlagERA-JTC2019 project "ETMOS"
6 · The paper itself

Abstract

Semiconducting transition metal dichalcogenides (TMDs) are promising materials for future electronic and optoelectronic applications. However, their electronic properties are strongly affected by peculiar nanoscale defects/inhomogeneities (point or complex defects, thickness fluctuations, grain boundaries, etc.), which are intrinsic of these materials or introduced during device fabrication processes. This paper reviews recent applications of conductive atomic force microscopy (C-AFM) to the investigation of nanoscale transport properties in TMDs, discussing the implications of the local phenomena in the overall behavior of TMD-based devices. Nanoscale resolution current spectroscopy and mapping by C-AFM provided information on the Schottky barrier uniformity and shed light on the mechanisms responsible for the Fermi level pinning commonly observed at metal/TMD interfaces. Methods for nanoscale tailoring of the Schottky barrier in MoS

Indexed as

conductive atomic force microscopyconductivityheterostructuresSchottky barriertransition metal dichalcogenides

Identifiers

PMID32331313
PMCPMC7221570

What OpenQuestion holds

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LicenceCC BY
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Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.