Evidence map›Paper›PMID 32221397›Full record

ArticleScientific reports2020

Influence of the reactor environment on the selective area thermal etching of GaN nanohole arrays.

Pierre-Marie Coulon, Peng Feng, Benjamin Damilano, Stéphane Vézian, Tao Wang, Philip A Shields

Abstract read
In one paragraph

Article in Scientific reports, 2020. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

6 authors.

Pierre-Marie CoulonDepartment Electrical & Electronic Engineering, University of Bath, Bath, BA2 7AY, UK. P.Coulon@bath.ac.uk.
Peng FengDepartment of Electronic and Electrical Engineering, University of Sheffield, Sheffield, S1 4DE, UK.
Benjamin DamilanoUniversité Côte d'Azur, CNRS, CRHEA, rue B. Gregory, 06560, Valbonne, France.
Stéphane VézianUniversité Côte d'Azur, CNRS, CRHEA, rue B. Gregory, 06560, Valbonne, France.
Tao WangDepartment of Electronic and Electrical Engineering, University of Sheffield, Sheffield, S1 4DE, UK.
Philip A ShieldsDepartment Electrical & Electronic Engineering, University of Bath, Bath, BA2 7AY, UK.

Funding

Agence Nationale de la Recherche ANR-18-CE24-0022Engineering and Physical Sciences Research Council EP/M015181/1Engineering and Physical Sciences Research Council EP/P006973/1
6 · The paper itself

Abstract

Selective area thermal etching (SATE) of gallium nitride is a simple subtractive process for creating novel device architectures and improving the structural and optical quality of III-nitride-based devices. In contrast to plasma etching, it allows, for example, the creation of enclosed features with extremely high aspect ratios without introducing ion-related etch damage. We report how SATE can create uniform and organized GaN nanohole arrays from c-plane and (11-22) semi-polar GaN in a conventional MOVPE reactor. The morphology, etching anisotropy and etch depth of the nanoholes were investigated by scanning electron microscopy for a broad range of etching parameters, including the temperature, the pressure, the NH

Identifiers

PMID32221397
PMCPMC7101372

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.