Evidence map›Paper›PMID 32124115›Full record

ArticleNanoscale research letters2020

Investigating Size-Dependent Conductive Properties on Individual Si Nanowires.

X F Hu, S J Li, J Wang, Z M Jiang, X J Yang

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PubMed Full text at PMC Publisher
In one paragraph

Article in Nanoscale research letters, 2020. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

5 authors.

X F HuState Key Laboratory of Surface Physics, Fudan University, Shanghai, 200433, China.
S J LiState Key Laboratory of Surface Physics, Fudan University, Shanghai, 200433, China.
J WangState Key Laboratory of Surface Physics, Fudan University, Shanghai, 200433, China.
Z M JiangState Key Laboratory of Surface Physics, Fudan University, Shanghai, 200433, China.
X J YangState Key Laboratory of Surface Physics, Fudan University, Shanghai, 200433, China. xjyang@fudan.edu.cn.ORCID http://orcid.org/0000-0002-6434-4342

Funding

Natural Science Foundation of Shanghai 17ZR1402600
6 · The paper itself

Abstract

Periodically ordered arrays of vertically aligned Si nanowires (Si NWs) are successfully fabricated by nanosphere lithography combined with metal-assisted chemical etching. By adjusting the etching time, both the nanowires' diameter and length can be well controlled. The conductive properties of such Si NWs and particularly their size dependence are investigated by conductive atomic force microscopy (CAFM) on individual nanowires. The results indicate that the conductance of Si NWs is greatly relevant to their diameter and length. Si NWs with smaller diameters and shorter lengths exhibit better conductive properties. Together with the I-V curve characterization, a possible mechanism is supposed with the viewpoint of size-dependent Schottky barrier height, which is further verified by the electrostatic force microscopy (EFM) measurements. This study also suggests that CAFM can act as an effective means to explore the size (or other parameters) dependence of conductive properties on individual nanostructures, which should be essential for both fabrication optimization and potential applications of nanostructures.

Indexed as

Conductive atomic force microscopyConductive propertySchottky barrier heightSi nanowiresSize dependence

Identifiers

PMID32124115
PMCPMC7052096

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.