Evidence map›Paper›PMID 31996971›Full record

ArticleTAG. Theoretical and applied genetics. Theoretische und angewandte Genetik2020

Genetic mapping using a wheat multi-founder population reveals a locus on chromosome 2A controlling resistance to both leaf and glume blotch caused by the necrotrophic fungal pathogen Parastagonospora nodorum.

Min Lin, Beatrice Corsi, Andrea Ficke, Kar-Chun Tan, James Cockram, Morten Lillemo

Abstract read
In one paragraph

Article in TAG. Theoretical and applied genetics. Theoretische und angewandte Genetik, 2020. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 23 papers.

0numbers the graph read from it
0cells of the map it votes in
23citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

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3 · Its place in the literature

Who cites it

23 citing papers in PubMed.

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  7. Genome-wide association mapping of septoria nodorum blotch resistance in Nordic winter and spring wheat collections.TAG. Theoretical and applied genetics. Theoretische und angewandte Genetik · 2022
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4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

6 authors.

Min LinDepartment of Plant Sciences, Norwegian University of Life Sciences, Post Box 5003, 1432, Ås, Norway.ORCID https://orcid.org/0000-0002-9209-3819
Beatrice CorsiJohn Bingham Laboratory, NIAB, Huntingdon Road, Cambridge, CB3 0LE, UK.ORCID https://orcid.org/0000-0003-0934-0530
Andrea FickeNorwegian Institute of Bioeconomy Research, Høgskoleveien 7, 1433, Ås, Norway.ORCID https://orcid.org/0000-0002-3438-3842
Kar-Chun TanCentre for Crop and Disease Management, School of Molecular and Life Sciences, Curtin University, Bentley, WA, Australia.ORCID https://orcid.org/0000-0001-6094-823X
James CockramJohn Bingham Laboratory, NIAB, Huntingdon Road, Cambridge, CB3 0LE, UK.ORCID https://orcid.org/0000-0002-1014-6463
Morten LillemoDepartment of Plant Sciences, Norwegian University of Life Sciences, Post Box 5003, 1432, Ås, Norway. morten.lillemo@nmbu.no.ORCID https://orcid.org/0000-0002-8594-8794

Funding

Biotechnology and Biological Sciences Research Council grant BB/N00518X/1Grains Research and Development Corporation grant CUR00023Norges Forskningsråd grant NFR251894
6 · The paper itself

Abstract

key messageA locus on wheat chromosome 2A was found to control field resistance to both leaf and glume blotch caused by the necrotrophic fungal pathogen Parastagonospora nodorum. The necrotrophic fungal pathogen Parastagonospora nodorum is the causal agent of Septoria nodorum leaf blotch and glume blotch, which are common wheat (Triticum aestivum L.) diseases in humid and temperate areas. Susceptibility to Septoria nodorum leaf blotch can partly be explained by sensitivity to corresponding P. nodorum necrotrophic effectors (NEs). Susceptibility to glume blotch is also quantitative; however, the underlying genetics have not been studied in detail. Here, we genetically map resistance/susceptibility loci to leaf and glume blotch using an eight-founder wheat multiparent advanced generation intercross population. The population was assessed in six field trials across two sites and 4 years. Seedling infiltration and inoculation assays using three P. nodorum isolates were also carried out, in order to compare quantitative trait loci (QTL) identified under controlled conditions with those identified in the field. Three significant field resistance QTL were identified on chromosomes 2A and 6A, while four significant seedling resistance QTL were detected on chromosomes 2D, 5B and 7D. Among these, QSnb.niab-2A.3 for field resistance to both leaf blotch and glume blotch was detected in Norway and the UK. Colocation with a QTL for seedling reactions against culture filtrate from a Norwegian P. nodorum isolate indicated the QTL could be caused by a novel NE sensitivity. The consistency of this QTL for leaf blotch at the seedling and adult plant stages and culture filtrate infiltration was confirmed by haplotype analysis. However, opposite effects for the leaf blotch and glume blotch reactions suggest that different genetic mechanisms may be involved.

Indexed as

AscomycotaChromosome MappingChromosomes, PlantDisease ResistanceFounder EffectNorwayPhenotypePlant DiseasesPlant LeavesQuantitative Trait LociTriticumUnited Kingdom

Identifiers

PMID31996971
PMCPMC7021668

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.