ArticleBeilstein journal of nanotechnology2019
Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process.
Article in Beilstein journal of nanotechnology, 2019. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 5 papers.
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Who cites it
5 citing papers in PubMed.
- 3D Customized Silica-Based AFM Probes Fabricated by Selective Laser Etching.Small methods · 2026Article
- Atomic force microscope protocols for characterising the elastoviscoplastic biomechanical properties of corneocytes.Communications biology · 2025Article
- Capacitive Based Micromachined Resonators for Low Level Mass Detection.Micromachines · 2020Review
- Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy.Sensors (Basel, Switzerland) · 2020Review
- An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization.Beilstein journal of nanotechnology · 2020Article
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Authors and funding
6 authors.
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Abstract
Employing polymer cantilevers has shown to outperform using their silicon or silicon nitride analogues concerning the imaging speed of atomic force microscopy (AFM) in tapping mode (intermittent contact mode with amplitude modulation) by up to one order of magnitude. However, tips of the cantilever made out of a polymer material do not meet the requirements for tip sharpness and durability. Combining the high imaging bandwidth of polymer cantilevers with making sharp and wear-resistant tips is essential for a future adoption of polymer cantilevers in routine AFM use. In this work, we have developed a batch fabrication process to integrate silicon nitride tips with an average tip radius of 9 ± 2 nm into high-speed SU8 cantilevers. Key aspects of the process are the mechanical anchoring of a moulded silicon nitride tip and a two-step release process. The fabrication recipe can be adjusted to any photo-processable polymer cantilever.
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