Evidence map›Paper›PMID 31819949›Full record

ArticleAnnals of work exposures and health2020

Workplace Emissions and Exposures During Semiconductor Nanowire Production, Post-production, and Maintenance Work.

Christina Isaxon, Karin Lovén, Linus Ludvigsson, Sudhakar Sivakumar, Anders Gudmundsson, Maria E Messing, Joakim Pagels, Maria Hedmer

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Article in Annals of work exposures and health, 2020. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.

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0cells of the map it votes in
3citing papers in PubMed
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1 · What the graph read from it

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2 · The registry

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3 · Its place in the literature

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3 citing papers in PubMed.

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4 · The record

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5 · Who and what money

Authors and funding

8 authors.

Christina IsaxonNanoLund, Lund University, Lund, Sweden.
Karin LovénNanoLund, Lund University, Lund, Sweden.
Linus LudvigssonNanoLund, Lund University, Lund, Sweden.
Sudhakar SivakumarNanoLund, Lund University, Lund, Sweden.
Anders GudmundssonNanoLund, Lund University, Lund, Sweden.
Maria E MessingNanoLund, Lund University, Lund, Sweden.
Joakim PagelsNanoLund, Lund University, Lund, Sweden.
Maria HedmerNanoLund, Lund University, Lund, Sweden.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

backgroundNanowires are a high-aspect-ratio material of increasing interest for a wide range of applications. A new and promising method to produce nanowires is by aerotaxy, where the wires are grown in a continuous stream of gas. The aerotaxy method can grow nanowires much faster than by more conventional methods. Nanowires have important properties in common with asbestos fibers, which indicate that there can be potential health effects if exposure occurs. No conclusive exposure (or emission) data from aerotaxy-production of nanowires has so far been published.

methodsDifferent work tasks during semiconductor nanowire production, post-production, and maintenance were studied. A combination of direct-reading instruments for number concentration (0.007-20 µm) and filter sampling was used to assess the emissions (a couple of centimeter from the emission sources), the exposure in the personal breathing zone (max 30 cm from nose-mouth), and the concentrations in the background zone (at least 3 m from any emission source). The filters were analyzed for metal dust composition and number concentration of nanowires. Various surfaces were sampled for nanowire contamination.

resultsThe particle concentrations in the emission zone (measured with direct-reading instruments) were elevated during cleaning of arc discharge, manual reactor cleaning, exchange of nanowire outflow filters, and sonication of substrates with nanowires. In the case of cleaning of the arc discharge and manual reactor cleaning, the emissions affected the concentrations in the personal breathing zone and were high enough to also affect the concentrations in the background. Filter analysis with electron microscopy could confirm the presence of nanowires in some of the air samples.

conclusionsOur results show that a major part of the potential for exposure occurs not during the actual manufacturing, but during the cleaning and maintenance procedures. The exposures and emissions were evaluated pre- and post-upscaling the production and showed that some work tasks (e.g. exchange of nanowire outflow filters and sonication of substrates with nanowires) increased the emissions post-upscaling.

Indexed as

Air Pollutants, OccupationalNanowiresOccupational ExposureSemiconductorsEnvironmental MonitoringHumansInhalation ExposureMaintenanceWorkplaceAir Pollutants, Occupationaldirect-reading instrumentselectron microscopymetal analysisoccupational exposureupscaling

Identifiers

PMID31819949
PMCPMC6935015

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.