Evidence map›Paper›PMID 31766105›Full record

ArticleMaterials (Basel, Switzerland)2019

Resistive Switching and Charge Transport in Laser-Fabricated Graphene Oxide Memristors: A Time Series and Quantum Point Contact Modeling Approach.

N Rodriguez, D Maldonado, F J Romero, F J Alonso, A M Aguilera, A Godoy, F Jimenez-Molinos, F G Ruiz, J B Roldan

Abstract read
In one paragraph

Article in Materials (Basel, Switzerland), 2019. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 2 papers.

0numbers the graph read from it
0cells of the map it votes in
2citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

2 citing papers in PubMed.

  1. Article
  2. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

9 authors.

N RodriguezDepartment of Electronics and Computer Technology, Science Faculty, University of Granada, Av. Fuentenueva s/n, 18071 Granada, Spain.ORCID 0000-0002-6032-6921
D MaldonadoDepartment of Electronics and Computer Technology, Science Faculty, University of Granada, Av. Fuentenueva s/n, 18071 Granada, Spain.
F J RomeroDepartment of Electronics and Computer Technology, Science Faculty, University of Granada, Av. Fuentenueva s/n, 18071 Granada, Spain.ORCID 0000-0002-1582-9626
F J AlonsoDepartment of Statistics and Operations Research, Science Faculty, University of Granada, Av. Fuentenueva s/n, 18071 Granada, Spain.ORCID 0000-0002-7547-0205
A M AguileraDepartment of Statistics and Operations Research, Science Faculty, University of Granada, Av. Fuentenueva s/n, 18071 Granada, Spain.
A GodoyDepartment of Electronics and Computer Technology, Science Faculty, University of Granada, Av. Fuentenueva s/n, 18071 Granada, Spain.ORCID 0000-0002-3014-8765
F Jimenez-MolinosDepartment of Electronics and Computer Technology, Science Faculty, University of Granada, Av. Fuentenueva s/n, 18071 Granada, Spain.ORCID 0000-0002-8866-7568
F G RuizDepartment of Electronics and Computer Technology, Science Faculty, University of Granada, Av. Fuentenueva s/n, 18071 Granada, Spain.ORCID 0000-0003-4659-2454
J B RoldanDepartment of Electronics and Computer Technology, Science Faculty, University of Granada, Av. Fuentenueva s/n, 18071 Granada, Spain.ORCID 0000-0003-1662-6457

Funding

Spanish Ministry of Science, Innovation and Universities FPU16/01451Spanish Ministry of Science, Innovation and Universities PGC2018-098860-B-I00Spanish Ministry of Science, Innovation and Universities TEC2017-84321-C4-3-RSpanish Ministry of Science, Innovation and Universities TEC2017-89955-P
6 · The paper itself

Abstract

This work investigates the sources of resistive switching (RS) in recently reported laser-fabricated graphene oxide memristors by means of two numerical analysis tools linked to the Time Series Statistical Analysis and the use of the Quantum Point Contact Conduction model. The application of both numerical procedures points to the existence of a filament connecting the electrodes that may be interrupted at a precise point within the conductive path, resulting in resistive switching phenomena. These results support the existing model attributing the memristance of laser-fabricated graphene oxide memristors to the modification of a conductive path stoichiometry inside the graphene oxide.

Indexed as

autocovariancegraphene oxidelasermemristorRRAMtime series modelingvariability

Identifiers

PMID31766105
PMCPMC6888125

What OpenQuestion holds

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.