Evidence map›Paper›PMID 31575018›Full record

ArticleMicromachines2019

Comparison of the Electrical Response of Cu and Ag Ion-Conducting SDC Memristors Over the Temperature Range 6 K to 300 K.

Kolton Drake, Tonglin Lu, Md Kamrul H Majumdar, Kristy A Campbell

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in Micromachines, 2019. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.

0numbers the graph read from it
0cells of the map it votes in
3citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

3 citing papers in PubMed.

  1. Article
  2. Structural and Parametric Identification of Knowm Memristors.Nanomaterials (Basel, Switzerland) · 2021
    Article
  3. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

4 authors.

Kolton DrakeDepartment of Electrical and Computer Engineering, Boise State University, Boise, ID 83725-2075, USA. minionqb@gmail.com.
Tonglin LuDepartment of Electrical and Computer Engineering, Boise State University, Boise, ID 83725-2075, USA. tanyalu@u.boisestate.edu.
Md Kamrul H MajumdarDepartment of Electrical and Computer Engineering, Boise State University, Boise, ID 83725-2075, USA. mdkamrulhassanma@u.boisestate.edu.
Kristy A CampbellDepartment of Electrical and Computer Engineering, Boise State University, Boise, ID 83725-2075, USA. kriscampbell@boisestate.edu.ORCID 0000-0003-3734-3616

Funding

Air Force Office of Scientific Research FA9550-07-1-0546Air Force Research Laboratory FA9453-08-2-0252
6 · The paper itself

Abstract

Electrical performance of self-directed channel (SDC) ion-conducting memristors which use Ag and Cu as the mobile ion source are compared over the temperature range of 6 K to 300 K. The Cu-based SDC memristors operate at temperatures as low as 6 K, whereas Ag-based SDC memristors are damaged if operated below 125 K. It is also observed that Cu reversibly diffuses into the active Ge

Indexed as

chalcogenideelectrochemical metallization cellelectrochemical metallization (ECM)ion conductionmemristorself-directed channel (SDC)

Identifiers

PMID31575018
PMCPMC6843820

What OpenQuestion holds

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Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.