Evidence map›Paper›PMID 31093003›Full record

ArticleJournal of microelectromechanical systems : a joint IEEE and ASME publication on microstructures, microactuators, microsensors, and microsystems2018

Particle Tracking of Microelectromechanical System Performance and Reliability.

Craig R Copeland, Craig D McGray, Jon Geist, Samuel M Stavis

Abstract read
In one paragraph

Article in Journal of microelectromechanical systems : a joint IEEE and ASME publication on microstructures, microactuators, microsensors, and microsystems, 2018. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 2 papers.

0numbers the graph read from it
0cells of the map it votes in
2citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

2 citing papers in PubMed.

  1. Article
  2. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

4 authors.

Craig R CopelandNational Institute of Standards and Technology, Gaithersburg, MD 20899 USA.ORCID 0000-0002-3340-0006
Craig D McGrayNational Institute of Standards and Technology, Gaithersburg, MD 20899 USA.
Jon GeistNational Institute of Standards and Technology, Gaithersburg, MD 20899 USA.
Samuel M StavisNational Institute of Standards and Technology, Gaithersburg, MD 20899 USA.ORCID 0000-0002-7108-1405

Funding

Intramural NIST DOC 9999-NIST
6 · The paper itself

Abstract

Microelectromechanical systems (MEMS) that require contact of moving parts to implement complex functions exhibit limits to their performance and reliability. Here, we advance our particle tracking method to measure MEMS motion

Indexed as

Fluorescencemotionparticlereliabilitystiction

Identifiers

PMID31093003
PMCPMC6512989

What OpenQuestion holds

Textmetadata
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Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.