ArticlePolymers2018
Theoretical Study on Synchronous Characterization of Surface and Interfacial Mechanical Properties of Thin-Film/Substrate Systems with Residual Stress Based on Pressure Blister Test Technique.
Article in Polymers, 2018. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 4 papers.
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Who cites it
4 citing papers in PubMed.
- Improved Synchronous Characterization Theory for Surface and Interface Mechanical Properties of Thin-Film/Substrate Systems: A Theoretical Study on Shaft-Loaded Blister Test Technique.Materials (Basel, Switzerland) · 2024Article
- A Theoretical Study on an Elastic Polymer Thin Film-Based Capacitive Wind-Pressure Sensor.Polymers · 2020Article
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Authors and funding
6 authors.
Funding
Abstract
In this study, based on the pressure blister test technique, a theoretical study on the synchronous characterization of surface and interfacial mechanical properties of thin-film/substrate systems with residual stress was presented, where the problem of axisymmetric deformation of a blistering film with initial stress was analytically solved and its closed-form solution was presented. The expressions to determine Poisson's ratios, Young's modulus, and residual stress of surface thin films were derived; the work done by the applied external load and the elastic energy stored in the blistering thin film were analyzed in detail and their expressions were derived; and the interfacial adhesion energy released per unit delamination area of thin-film/substrate (i.e., energy release rate) was finally presented. The synchronous characterization technique presented here has theoretically made a big step forward, due to the consideration for the residual stress in surface thin films.
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