ArticleActa crystallographica. Section A, Foundations and advances2019
Resolving 500 nm axial separation by multi-slice X-ray ptychography.
Article in Acta crystallographica. Section A, Foundations and advances, 2019. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 4 papers.
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Who cites it
4 citing papers in PubMed.
- Multi-beam multi-slice X-ray ptychography.Scientific reports · 2025Article
- Using a modified double deep image prior for crosstalk mitigation in multislice ptychography.Journal of synchrotron radiation · 2021Article
- Adorym: a multi-platform generic X-ray image reconstruction framework based on automatic differentiation.Optics express · 2021Article
- Multi-slice ptychography enables high-resolution measurements in extended chemical reactors.Scientific reports · 2021Article
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12 authors.
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Abstract
Multi-slice X-ray ptychography offers an approach to achieve images with a nanometre-scale resolution from samples with thicknesses larger than the depth of field of the imaging system by modeling a thick sample as a set of thin slices and accounting for the wavefront propagation effects within the specimen. Here, we present an experimental demonstration that resolves two layers of nanostructures separated by 500 nm along the axial direction, with sub-10 nm and sub-20 nm resolutions on two layers, respectively. Fluorescence maps are simultaneously measured in the multi-modality imaging scheme to assist in decoupling the mixture of low-spatial-frequency features across different slices. The enhanced axial sectioning capability using correlative signals obtained from multi-modality measurements demonstrates the great potential of the multi-slice ptychography method for investigating specimens with extended dimensions in 3D with high resolution.
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