ArticleSensors (Basel, Switzerland)2018
On the Use of Focused Incident Near-Field Beams in Microwave Imaging.
Article in Sensors (Basel, Switzerland), 2018. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 4 papers.
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Who cites it
4 citing papers in PubMed.
- Minimal Focal Spot Size Measured Based on Intensity and Power Flow.Sensors (Basel, Switzerland) · 2021Article
- Review
- Evaluation of a Dielectric-Only Transmitarray for Generating Multi-Focusing Near-Field Spots Using a Cluster of Feeds in the Ka-Band.Sensors (Basel, Switzerland) · 2021Article
- On the Orbital Angular Momentum Incident Fields in Linearized Microwave Imaging.Sensors (Basel, Switzerland) · 2020Article
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Authors and funding
2 authors.
Funding
No grant is acknowledged in the PubMed record.
Abstract
We consider the use of focused incident near-field (NF) beams to interrogate the object of interest (OI) in NF microwave imaging (MWI). To this end, we first discuss how focused NF beams can be advantageously utilized to suppress scattering effects from the neighbouring objects whose unknown dielectric properties are not of interest (i.e., undesired scatterers). We then discuss how this approach can also be helpful in reducing the required measured data points to perform imaging. Driven by the relation between the electromagnetic inverse source and inverse scattering problems, our approach emphasizes the importance of tailoring the induced contrast sources in the imaging domain through the utilized incident NF beams. To demonstrate this idea, we consider two recently-proposed NF beams, and simulate them for imaging applications. The first one is a subwavelength focused NF beam generated by a passive NF plate, and the other is a Bessel beam generated by a leaky radial waveguide. Simple imaging examples are considered to explore the potential advantages of this approach, in particular, toward mainly
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