ArticleNature communications2018
Tomographic and multimodal scattering-type scanning near-field optical microscopy with peak force tapping mode.
Article in Nature communications, 2018. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 7 papers.
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Who cites it
7 citing papers in PubMed.
- Fundamental optical phenomena of strongly anisotropic polaritons at the nanoscale.Nature nanotechnology · 2026Review
- Characterizing nanoscale spatiotemporal defects of multi-layered MoSeNanophotonics (Berlin, Germany) · 2025Article
- Scanning Probe Nano-Infrared Imaging and Spectroscopy of Biochemical and Natural Materials.Small science · 2024Article
- Roadmap on Label-Free Super-Resolution Imaging.Laser & photonics reviews · 2023Article
- High-fidelity nano-FTIR spectroscopy by on-pixel normalization of signal harmonics.Nanophotonics (Berlin, Germany) · 2022Article
- Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode.Beilstein journal of nanotechnology · 2021Article
- Simultaneous Nanoscale Imaging of Chemical and Architectural Heterogeneity on Yeast Cell Wall Particles.Langmuir : the ACS journal of surfaces and colloids · 2020Article
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Authors and funding
4 authors.
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Abstract
Scattering-type scanning near-field optical microscopy (s-SNOM) enables nanoscale spectroscopic imaging and has been instrumental for many nano-photonic discoveries and in situ studies. However, conventional s-SNOM techniques with atomic force microscopy tapping mode operation and lock-in detections do not provide direct tomographic information with explicit tip-sample distance. Here, we present a non-traditional s-SNOM technique, named peak force scattering-type scanning near-field optical microscopy (PF-SNOM), by combination of peak force tapping mode and time-gated light detection. PF-SNOM enables direct sectioning of vertical near-field signals from a sample surface for both three-dimensional near-field imaging and spectroscopic analysis. Tip-induced relaxation of surface phonon polaritons are revealed and modeled by considering tip damping. PF-SNOM also delivers a spatial resolution of 5 nm and can simultaneously measure mechanical and electrical properties together with optical near-field signals. PF-SNOM is expected to facilitate three-dimensional nanoscale near-field characterizations and correlative in situ investigations on light-induced mechanical and electrical effects.
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