Evidence map›Paper›PMID 29298986›Full record

ArticleNature communications2018

Electrically reversible cracks in an intermetallic film controlled by an electric field.

Z Q Liu, J H Liu, M D Biegalski, J-M Hu, S L Shang, Y Ji, J M Wang, S L Hsu, A T Wong, M J Cordill and 13 more

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in Nature communications, 2018. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 4 papers.

0numbers the graph read from it
0cells of the map it votes in
4citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

4 citing papers in PubMed.

  1. Article
  2. Article
  3. Article
  4. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

23 authors.

Z Q LiuSchool of Materials Science and Engineering, Beihang University, Beijing, 100191, China. zhiqi@buaa.edu.cn.
J H LiuSchool of Materials Science and Engineering, Beihang University, Beijing, 100191, China.
M D BiegalskiCenter for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.
J-M HuDepartment of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, 16802, USA.
S L ShangDepartment of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, 16802, USA.
Y JiDepartment of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, 16802, USA.
J M WangSchool of Materials Science and Engineering, Beihang University, Beijing, 100191, China.
S L HsuDepartment of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA.
A T WongMaterials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.
M J CordillErich Schmid Institute of Materials Science, Austrian Academy of Sciences, and Department of Material Physics, Montanuniversität Leoben, Jahnstr. 12, 8700, Leoben, Austria.
B GludovatzSchool of Mechanical and Manufacturing Engineering, UNSW Sydney, Sydney, NSW, 2052, Australia.
C MarkerDepartment of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, 16802, USA.
H YanSchool of Materials Science and Engineering, Beihang University, Beijing, 100191, China.
Z X FengSchool of Materials Science and Engineering, Beihang University, Beijing, 100191, China.
L YouSchool of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, China.
M W LinCenter for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.
T Z WardMaterials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.ORCID http://orcid.org/0000-0002-1027-9186
Z K LiuDepartment of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, 16802, USA.
C B JiangSchool of Materials Science and Engineering, Beihang University, Beijing, 100191, China.
L Q ChenDepartment of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, 16802, USA.
R O RitchieDepartment of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA.ORCID http://orcid.org/0000-0002-0501-6998
H M ChristenCenter for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.
R RameshDepartment of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Cracks in solid-state materials are typically irreversible. Here we report electrically reversible opening and closing of nanoscale cracks in an intermetallic thin film grown on a ferroelectric substrate driven by a small electric field (~0.83 kV/cm). Accordingly, a nonvolatile colossal electroresistance on-off ratio of more than 10

Identifiers

PMID29298986
PMCPMC5752679

What OpenQuestion holds

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.