ArticleScientific reports2017
Full-wave modeling of broadband near field scanning microwave microscopy.
Article in Scientific reports, 2017. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.
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Who cites it
3 citing papers in PubMed.
- High-Resolution Detection of Rock-Forming Minerals by Permittivity Measurements with a Near-Field Scanning Microwave Microscope.Sensors (Basel, Switzerland) · 2022Article
- Detection of Anti-Counterfeiting Markers through Permittivity Maps Using a Micrometer Scale near Field Scanning Microwave Microscope.Sensors (Basel, Switzerland) · 2021Article
- Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy.Nanomaterials (Basel, Switzerland) · 2021Article
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Authors and funding
4 authors.
Funding
No grant is acknowledged in the PubMed record.
Abstract
A three-dimensional finite element numerical modeling for the scanning microwave microscopy (SMM) setup is applied to study the full-wave quantification of the local material properties of samples. The modeling takes into account the radiation and scattering losses of the nano-sized probe neglected in previous models based on low-frequency assumptions. The scanning techniques of approach curves and constant height are implemented. In addition, we conclude that the SMM has the potential for use as a broadband dielectric spectroscopy operating at higher frequencies up to THz. The results demonstrate the accuracy of previous models. We draw conclusions in light of the experimental results.
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Registered trials
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