ArticleProceedings of SPIE--the International Society for Optical Engineering2017
High-resolution extremity cone-beam CT with a CMOS detector: Task-based optimization of scintillator thickness.
Article in Proceedings of SPIE--the International Society for Optical Engineering, 2017. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.
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Who cites it
3 citing papers in PubMed.
- Robust Quantitative Assessment of Trabecular Microarchitecture in Extremity Cone-Beam CT Using Optimized Segmentation Algorithms.Proceedings of SPIE--the International Society for Optical Engineering · 2018Article
- High-Resolution Extremity Cone-Beam CT with a CMOS Detector: Evaluation of a Clinical Prototype in Quantitative Assessment of Bone Microarchitecture.Proceedings of SPIE--the International Society for Optical Engineering · 2018Article
- Modeling and evaluation of a high-resolution CMOS detector for cone-beam CT of the extremities.Medical physics · 2018Article
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7 authors.
Funding
Abstract
purposeCMOS x-ray detectors offer small pixel sizes and low electronic noise that may support the development of novel high-resolution imaging applications of cone-beam CT (CBCT). We investigate the effects of CsI scintillator thickness on the performance of CMOS detectors in high resolution imaging tasks, in particular in quantitative imaging of bone microstructure in extremity CBCT.
methodsA scintillator thickness-dependent cascaded systems model of CMOS x-ray detectors was developed. Detectability in low-, high- and ultra-high resolution imaging tasks (Gaussian with FWHM of ~250
resultsExperimental studies show ~35% improvement in the frequency of 50% MTF modulation when using the 400
conclusionApplications on CMOS detectors in high resolution CBCT imaging of trabecular bone will benefit from using a thinner scintillator than the current standard in general radiography. The results support the translation of the CMOS sensor with 400
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