Evidence map›Paper›PMID 27690043›Full record

ArticleSensors (Basel, Switzerland)2016

Fast Industrial Inspection of Optical Thin Film Using Optical Coherence Tomography.

Muhammad Faizan Shirazi, Kibeom Park, Ruchire Eranga Wijesinghe, Hyosang Jeong, Sangyeob Han, Pilun Kim, Mansik Jeon, Jeehyun Kim

Abstract read
In one paragraph

Article in Sensors (Basel, Switzerland), 2016. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 15 papers.

0numbers the graph read from it
0cells of the map it votes in
15citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

15 citing papers in PubMed.

  1. Article
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  5. Review
  6. Non-destructive morphological observation of anatomical growth process in Haemaphysalis Longicornis tick specimens using optical coherence tomography.Technology and health care : official journal of the European Society for Engineering and Medicine · 2022
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4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

8 authors.

Muhammad Faizan ShiraziSchool of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80 Daehak-ro, Bukgu, Daegu 41566, Korea. faizanshirazi110@gmail.com.
Kibeom ParkSchool of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80 Daehak-ro, Bukgu, Daegu 41566, Korea. pepl10@knu.ac.kr.
Ruchire Eranga WijesingheSchool of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80 Daehak-ro, Bukgu, Daegu 41566, Korea. eranga@knu.ac.kr.
Hyosang JeongOz-tec Co. Ltd., Office 901, IT Convergence Industrial Building, 47 Gyeongdae-ro, 17-gil, Bukgu, Daegu 41566, Korea. hsjeong@oz-tec.com.
Sangyeob HanOz-tec Co. Ltd., Office 901, IT Convergence Industrial Building, 47 Gyeongdae-ro, 17-gil, Bukgu, Daegu 41566, Korea. syhan@oz-tec.com.
Pilun KimOz-tec Co. Ltd., Office 901, IT Convergence Industrial Building, 47 Gyeongdae-ro, 17-gil, Bukgu, Daegu 41566, Korea. pukim@oz-tec.com.
Mansik JeonSchool of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80 Daehak-ro, Bukgu, Daegu 41566, Korea. msjeon@knu.ac.kr.
Jeehyun KimSchool of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80 Daehak-ro, Bukgu, Daegu 41566, Korea. jeehk@knu.ac.kr.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

An application of spectral domain optical coherence tomography (SD-OCT) was demonstrated for a fast industrial inspection of an optical thin film panel. An optical thin film sample similar to a liquid crystal display (LCD) panel was examined. Two identical SD-OCT systems were utilized for parallel scanning of a complete sample in half time. Dual OCT inspection heads were utilized for transverse (fast) scanning, while a stable linear motorized translational stage was used for lateral (slow) scanning. The cross-sectional and volumetric images of an optical thin film sample were acquired to detect the defects in glass and other layers that are difficult to observe using visual inspection methods. The rapid inspection enabled by this setup led to the early detection of product defects on the manufacturing line, resulting in a significant improvement in the quality assurance of industrial products.

Indexed as

GPUindustrial inspectionLCDOCToptical thin film

Identifiers

PMID27690043
PMCPMC5087387

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.