ArticleSensors (Basel, Switzerland)2015
Improving the lateral resolution of quartz tuning fork-based sensors in liquid by integrating commercial AFM tips into the fiber end.
Article in Sensors (Basel, Switzerland), 2015. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 4 papers.
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Who cites it
4 citing papers in PubMed, 9 citations in OpenAlex.
- Spider Silk-Improved Quartz-Enhanced Conductance Spectroscopy for Medical Mask Humidity Sensing.Molecules (Basel, Switzerland) · 2022Article
- Atomic Force Microscopy Imaging in Turbid Liquids: A Promising Tool in Nanomedicine.Sensors (Basel, Switzerland) · 2020Article
- Atomic Force Microscopy Sidewall Imaging with a Quartz Tuning Fork Force Sensor.Sensors (Basel, Switzerland) · 2018Article
- Visualized Multiprobe Electrical Impedance Measurements with STM Tips Using Shear Force Feedback Control.Sensors (Basel, Switzerland) · 2016Article
Corrections and comments
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Authors and funding
6 authors at 2 institutions in 1 country.
Funding
No grant is acknowledged in the PubMed record.
Abstract
The use of quartz tuning fork sensors as probes for scanning probe microscopy is growing in popularity. Working in shear mode, some methods achieve a lateral resolution comparable with that obtained with standard cantilevered probes, but only in experiments conducted in air or vacuum. Here, we report a method to produce and use commercial AFM tips in electrically driven quartz tuning fork sensors operating in shear mode in a liquid environment. The process is based on attaching a standard AFM tip to the end of a fiber probe which has previously been sharpened. Only the end of the probe is immersed in the buffer solution during imaging. The lateral resolution achieved is about 6 times higher than that of the etched microfiber on its own.
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