ArticleProceedings of the National Academy of Sciences of the United States of America2014
Absolute position total internal reflection microscopy with an optical tweezer.
Article in Proceedings of the National Academy of Sciences of the United States of America, 2014. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 5 papers.
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Who cites it
5 citing papers in PubMed.
- Stable optical lateral forces from inhomogeneities of the spin angular momentum.Science advances · 2022Article
- Article
- Elliptical orbits of microspheres in an evanescent field.Proceedings of the National Academy of Sciences of the United States of America · 2017Article
- Drosophila Dunc-115 mediates axon projection through actin binding.Invertebrate neuroscience : IN · 2017Article
- Dynamics of an optically confined nanoparticle diffusing normal to a surface.Physical review. E · 2016Article
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Authors and funding
4 authors.
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Abstract
A noninvasive, in situ calibration method for total internal reflection microscopy (TIRM) based on optical tweezing is presented, which greatly expands the capabilities of this technique. We show that by making only simple modifications to the basic TIRM sensing setup and procedure, a probe particle's absolute position relative to a dielectric interface may be known with better than 10 nm precision out to a distance greater than 1 μm from the surface. This represents an approximate 10× improvement in error and 3× improvement in measurement range over conventional TIRM methods. The technique's advantage is in the direct measurement of the probe particle's scattering intensity vs. height profile in situ, rather than relying on assumptions, inexact system analogs, or detailed knowledge of system parameters for calibration. To demonstrate the improved versatility of the TIRM method in terms of tunability, precision, and range, we show our results for the hindered near-wall diffusion coefficient for a spherical dielectric particle.
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