ArticleBeilstein journal of nanotechnology2013
Multiple regimes of operation in bimodal AFM: understanding the energy of cantilever eigenmodes.
Article in Beilstein journal of nanotechnology, 2013. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 13 papers.
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13 citing papers in PubMed.
- Bimodal Atomic Force Microscopy with a Torsional Eigenmode for Highly Accurate Imaging of Grain Orientation in Organic Thin Films.Nano letters · 2025Article
- Multifrequency AFM integrating PeakForce tapping and higher eigenmodes for heterogeneous surface characterization.Beilstein journal of nanotechnology · 2025Article
- Enhancing higher-order modal response in multifrequency atomic force microscopy with a coupled cantilever system.Beilstein journal of nanotechnology · 2024Article
- Characteristics and Functionality of Cantilevers and Scanners in Atomic Force Microscopy.Materials (Basel, Switzerland) · 2023Review
- Article
- Design of V-shaped cantilevers for enhanced multifrequency AFM measurements.Beilstein journal of nanotechnology · 2020Article
- Article
- Improving image contrast and material discrimination with nonlinear response in bimodal atomic force microscopy.Nature communications · 2015Article
- Optimization of phase contrast in bimodal amplitude modulation AFM.Beilstein journal of nanotechnology · 2015Article
- Unlocking higher harmonics in atomic force microscopy with gentle interactions.Beilstein journal of nanotechnology · 2014Article
- Probing viscoelastic surfaces with bimodal tapping-mode atomic force microscopy: Underlying physics and observables for a standard linear solid model.Beilstein journal of nanotechnology · 2014Article
- Multi-frequency tapping-mode atomic force microscopy beyond three eigenmodes in ambient air.Beilstein journal of nanotechnology · 2014Article
- Challenges and complexities of multifrequency atomic force microscopy in liquid environments.Beilstein journal of nanotechnology · 2014Article
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3 authors.
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Abstract
One of the key goals in atomic force microscopy (AFM) imaging is to enhance material property contrast with high resolution. Bimodal AFM, where two eigenmodes are simultaneously excited, confers significant advantages over conventional single-frequency tapping mode AFM due to its ability to provide contrast between regions with different material properties under gentle imaging conditions. Bimodal AFM traditionally uses the first two eigenmodes of the AFM cantilever. In this work, the authors explore the use of higher eigenmodes in bimodal AFM (e.g., exciting the first and fourth eigenmodes). It is found that such operation leads to interesting contrast reversals compared to traditional bimodal AFM. A series of experiments and numerical simulations shows that the primary cause of the contrast reversals is not the choice of eigenmode itself (e.g., second versus fourth), but rather the relative kinetic energy between the higher eigenmode and the first eigenmode. This leads to the identification of three distinct imaging regimes in bimodal AFM. This result, which is applicable even to traditional bimodal AFM, should allow researchers to choose cantilever and operating parameters in a more rational manner in order to optimize resolution and contrast during nanoscale imaging of materials.
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