ArticleProceedings of the National Academy of Sciences of the United States of America2013
Graphene-layered steps and their fields visualized by 4D electron microscopy.
Article in Proceedings of the National Academy of Sciences of the United States of America, 2013. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 5 papers.
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Who cites it
5 citing papers in PubMed, 28 citations in OpenAlex.
- Precision-controlled ultrafast electron microscope platforms. A case study: Multiple-order coherent phonon dynamics in 1T-TaSeStructural dynamics (Melville, N.Y.) · 2024Article
- Nanoscale-femtosecond dielectric response of Mott insulators captured by two-color near-field ultrafast electron microscopy.Nature communications · 2020Article
- From structure to structural dynamics: Ahmed Zewail's legacy.Structural dynamics (Melville, N.Y.) · 2017Article
- Infrared PINEM developed by diffraction in 4D UEM.Proceedings of the National Academy of Sciences of the United States of America · 2016Article
- Photon gating in four-dimensional ultrafast electron microscopy.Proceedings of the National Academy of Sciences of the United States of America · 2015Article
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Authors and funding
4 authors at 1 institution in 1 country.
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Abstract
Enhanced image contrast has been seen at graphene-layered steps a few nanometers in height by means of photon-induced near-field electron microscopy (PINEM) using synchronous femtosecond pulses of light and electrons. The observed steps are formed by the edges of graphene strips lying on the surface of a graphene substrate, where the strips are hundreds of nanometers in width and many micrometers in length. PINEM measurements reflect the interaction of imaging electrons and induced (near) electric fields at the steps, and this leads to a much higher contrast than that achieved in bright-field transmission electron microscopy imaging of the same strips. Theory and numerical simulations support the experimental PINEM findings and elucidate the nature of the electric field at the steps formed by the graphene layers. These results extend the range of applications of the experimental PINEM methodology, which has previously been demonstrated for spherical, cylindrical, and triangular nanostructures, to shapes of high aspect ratio (rectangular strips), as well as into the regime of atomic layer thicknesses.
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