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ArticleMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada2012

The probe profile and lateral resolution of scanning transmission electron microscopy of thick specimens.

Hendrix Demers et al.PubMed ↗Full text ↗Publisher ↗

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Full record →Abstract, authors, funding and every citing paper · PMID 22564444