ArticleProceedings of the National Academy of Sciences of the United States of America2010
Scanning ultrafast electron microscopy.
Article in Proceedings of the National Academy of Sciences of the United States of America, 2010. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 13 papers.
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Who cites it
13 citing papers in PubMed.
- Roadmap for Quantum Nanophotonics with Free Electrons.ACS photonics · 2025Review
- Imaging hot photocarrier transfer across a semiconductor heterojunction with ultrafast electron microscopy.Proceedings of the National Academy of Sciences of the United States of America · 2024Article
- Mapping Surface-Defect and Ions Migration in Mixed-Cation Perovskite Crystals.Advanced science (Weinheim, Baden-Wurttemberg, Germany) · 2024Article
- A Femtosecond Electron-Based Versatile Microscopy for Visualizing Carrier Dynamics in Semiconductors Across Spatiotemporal and Energetic Domains.Advanced science (Weinheim, Baden-Wurttemberg, Germany) · 2024Article
- Picosecond carrier dynamics in InAs and GaAs revealed by ultrafast electron microscopy.Science advances · 2024Article
- Spatiotemporal Visualization of Photogenerated Carriers on an Avalanche Photodiode Surface Using Ultrafast Scanning Electron Microscopy.Nanomaterials (Basel, Switzerland) · 2024Article
- Progress and Prospects in Optical Ultrafast Microscopy in the Visible Spectral Region: Transient Absorption and Two-Dimensional Microscopy.The journal of physical chemistry. C, Nanomaterials and interfaces · 2023Review
- An Adversarial Learning Approach for Super-Resolution Enhancement Based on AgCl@Ag Nanoparticles in Scanning Electron Microscopy Images.Nanomaterials (Basel, Switzerland) · 2021Article
- Ultrafast electron imaging of surface charge carrier dynamics at low voltage.Structural dynamics (Melville, N.Y.) · 2020Article
- Photoemission sources and beam blankers for ultrafast electron microscopy.Structural dynamics (Melville, N.Y.) · 2019Review
- Photo-excited hot carrier dynamics in hydrogenated amorphous silicon imaged by 4D electron microscopy.Nature nanotechnology · 2017Article
- Optical gating and streaking of free electrons with sub-optical cycle precision.Nature communications · 2017Article
- Visualization of carrier dynamics in p(n)-type GaAs by scanning ultrafast electron microscopy.Proceedings of the National Academy of Sciences of the United States of America · 2014Article
Corrections and comments
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Authors and funding
3 authors.
Funding
No grant is acknowledged in the PubMed record.
Abstract
Progress has been made in the development of four-dimensional ultrafast electron microscopy, which enables space-time imaging of structural dynamics in the condensed phase. In ultrafast electron microscopy, the electrons are accelerated, typically to 200 keV, and the microscope operates in the transmission mode. Here, we report the development of scanning ultrafast electron microscopy using a field-emission-source configuration. Scanning of pulses is made in the single-electron mode, for which the pulse contains at most one or a few electrons, thus achieving imaging without the space-charge effect between electrons, and still in ten(s) of seconds. For imaging, the secondary electrons from surface structures are detected, as demonstrated here for material surfaces and biological specimens. By recording backscattered electrons, diffraction patterns from single crystals were also obtained. Scanning pulsed-electron microscopy with the acquired spatiotemporal resolutions, and its efficient heat-dissipation feature, is now poised to provide in situ 4D imaging and with environmental capability.
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